VMIVME-2540-000

¥6,233.00

argument
Event count: Up to 4g events are supported
Programming outputs: up to 24 discrete outputs
CPU: Onboard 15 MHz 68HC000 CPU
VME interface: A32/A24/D32/D16/D8 (EO) VME secondary interface, 64 Kbyte VMEbus memory window
Data exchange interface: ANSI/IEEE standard 754-1985 for 32-bit floating-point operations
specification
Measuring function:
Event count
Frequency measurement (1.16 x 10^-3 Hz to 2.5 MHz)
Period/pulse width measurement (400 ns to 8.5899 x 10^6 s)
Orthogonal position measurement
Generation function:
Pulse train/square wave generation (0.0076 Hz to 2.5 MHz)
The timer/period interrupt is generated
Frequency division
Orthogonal position control
Category:

Description

argument
Event count: Up to 4g events are supported
Programming outputs: up to 24 discrete outputs
CPU: Onboard 15 MHz 68HC000 CPU
VME interface: A32/A24/D32/D16/D8 (EO) VME secondary interface, 64 Kbyte VMEbus memory window
Data exchange interface: ANSI/IEEE standard 754-1985 for 32-bit floating-point operations
specification
Measuring function:
Event count
Frequency measurement (1.16 x 10^-3 Hz to 2.5 MHz)
Period/pulse width measurement (400 ns to 8.5899 x 10^6 s)
Orthogonal position measurement
Generation function:
Pulse train/square wave generation (0.0076 Hz to 2.5 MHz)
The timer/period interrupt is generated
Frequency division
Orthogonal position control
dimension
Product size: 115mm x 48mm x 150mm
weight
Product weight: about 1.2kg
trait
High precision: Provides high precision digital measurement and generation capabilities
Multi-function: Supports a variety of measurement and generation functions, such as event counting, frequency measurement, pulse width measurement, orthogonal position measurement, pulse train generation, etc
Flexible interface: With a simple memory-mapped user interface, users can configure measurement, timing, and output functions for each channel
Wide application: Suitable for rotary axis instrument, automotive testing, medical, robotics, telescope/observatory, linear position measurement and other fields

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