NI PXIE-6571

¥6,305.00

The NI PXIe-6571 is a high-performance digital pattern instrument specifically designed for semiconductor characteristics analysis and production testing. Here is an overview of its key parameters, specifications, dimensions, weight, series, features, and functions in English:
Parameters and Specifications:
Brand: National Instruments (NI).
Model: PXIe-6571.
Platform: PXI (Peripheral Component Interconnect Express).
Number of Channels: 32 channels.
Voltage Range: -2 V to 6 V.
Data Rate: Up to 200 Mb/s.
Clock Frequency: Up to 160 MHz.
Dimensions and Weight:
Exact dimensions and weight may vary depending on the manufacturer and specific configuration. It is recommended to refer to the manufacturer’s official documentation or contact them directly for precise measurements.
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Description

The NI PXIe-6571 is a high-performance digital pattern instrument specifically designed for semiconductor characteristics analysis and production testing. Here is an overview of its key parameters, specifications, dimensions, weight, series, features, and functions in English:
Parameters and Specifications:
Brand: National Instruments (NI).
Model: PXIe-6571.
Platform: PXI (Peripheral Component Interconnect Express).
Number of Channels: 32 channels.
Voltage Range: -2 V to 6 V.
Data Rate: Up to 200 Mb/s.
Clock Frequency: Up to 160 MHz.
Dimensions and Weight:
Exact dimensions and weight may vary depending on the manufacturer and specific configuration. It is recommended to refer to the manufacturer’s official documentation or contact them directly for precise measurements.
Series:
The NI PXIe-6571 belongs to the PXI digital pattern instrument series offered by National Instruments.
Features:
Pattern Editor: Provides a digital pattern editor for configuring pin maps, parameters, levels, timing, and patterns.
Debugging Tools: Includes debugging features such as Shmoo, digital oscilloscope, and viewers for historical RAM, pin status, and system status.
ATE-Level Functionality: Incorporates ATE (Automatic Test Equipment)-level digital functions into a compact desktop instrument.
Flexibility: Designed for remote debugging, flexible testing, and seamless integration from the lab to production applications.
Functions/Role:
Semiconductor Testing: The NI PXIe-6571 is used for the characteristics analysis and production testing of semiconductor devices.
Pattern Generation and Execution: It can generate and execute digital patterns for testing and validation purposes.
Integration with Other Systems: The module can be integrated into larger test and measurement systems, enabling seamless data exchange and coordinated operation with other components.

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