Description
The NI PXIE-6556 is a high-performance digital I/O module designed by National Instruments (NI) for a range of testing and measurement applications. Here is a detailed overview of its parameters, specifications, dimensions, weight, series, features, and functions in English:
Parameters and Specifications:
Number of Channels: The module offers 24 channels, each with Programmable Power Supply Measurement Unit (PPMU) functionality.
Voltage Range: The voltage range can vary, with some specifications indicating -2 V to 7 V or -1 V to 7V, while others mention -2.0 to 7.0 V.
Data Rate: The maximum data rate is 200 MHz, making it suitable for high-speed digital waveform generation and analysis.
PPMU Functionality: Each channel’s PPMU enables the module to drive and measure both current and voltage.
Dimensions and Weight:
Dimensions: The module measures approximately 21.6 cm × 2.0 cm × 13.0 cm.
Weight: The NI PXIE-6556 weighs approximately 28 ounces or around 0.79 kg.
Series:
The NI PXIE-6556 belongs to the NI PXI platform series of high-performance modules for testing and measurement applications.
Features:
Flexibility: The module’s PPMU functionality allows for precise DC parameter measurements, enabling it to be used in a wide range of testing scenarios.
High-Speed Digital I/O: The 200 MHz clock rate supports high-speed digital waveform generation and analysis, simplifying wiring and reducing test time.
Timing Calibration: Built-in timing calibration helps eliminate timing offsets caused by different connections and line lengths.
Easy Integration: The module can be integrated with other devices, such as power supplies, digitizers, and switches, to create multifunctional, high-performance mixed-signal testing systems.
Function/Role:
Testing and Measurement: The NI PXIE-6556 is designed for use in validation or production testing, enabling engineers to generate and acquire high-speed digital waveforms or perform DC parameter measurements on a single pin with high accuracy.
Semiconductor Characterization: It is particularly suitable for semiconductor characteristic description and production testing, providing reliable and flexible digital I/O functionality.
System Integration: With its ability to integrate with other test equipment, the NI PXIE-6556 can be a key component in larger, mixed-signal testing systems.
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