Description
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Parameters and Specifications:
- Model: GU-D08
- Brand: Mitsubishi
Dimensions and Weight:
- Size (Approximate): 310×138×400mm
- Weight: 18kg
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Features:
- Optimized Design: Based on standard semiconductor characteristic instruments, with small size, high reliability, and ease of use1
- Alternating Measurement Display: Allows simultaneous display of diode’s forward and reverse characteristics1
- High Voltage and Current Capabilities: Collector scan voltage up to 5kV and current up to 2A, suitable for testing various semiconductor devices in household appliances1
- Applicable Devices: Supports testing of triodes, diodes, field-effect transistors, thyristors, voltage regulators, and three-terminal regulators
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Applications and Roles:
- Semiconductor Device Testing: Used for testing and analyzing the performance of semiconductor devices1
- Industrial Automation: Part of industrial automation systems that require precise control and measurement of semiconductor components
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