Description
Parameters and Specifications:
- Brand: Mitsubishi
- Model: GU-D08
- Type: IGCT Controllable Silicon1
- Dimensions: 310×138×400mm1
- Weight: 18kg1
Series:
- Part of Mitsubishi’s semiconductor or electronic components series1.
Features:
- Compact Design: With dimensions of 310×138×400mm and a weight of 18kg, it offers a compact and lightweight solution1.
- High Reliability: Optimized design based on standard semiconductor characteristic testers, ensuring high reliability1.
- User-Friendly: Easy to use with alternating measurement display function, able to display forward and reverse characteristics of diodes simultaneously1.
- Versatile: Suitable for testing various semiconductor devices in household appliances, such as triodes, diodes, field effect tubes, controllable silicon, Zener diodes, and three-terminal regulators1.
- High Performance: With a collector scanning voltage up to 5kV and a current up to 2A, it satisfies most testing needs1.
Applications:
- Used in testing and evaluating the performance of semiconductor devices in various industries and applications1.
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